Books /The Physics of Charged Particle Beams

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The Physics of Charged Particle Beams

ISBN

9798888365564-2025

Author

Aaron Zimmerman

Publisher

Larsen and Keller Education

Language

English

Publication Year

2025

Category

Physics - Physics

Pages

100

Price

USD 160

Description

Charged particle beams are streams of charged particles, such as electrons, protons, or ions, accelerated to high velocities. These beams are fundamental in various fields of science and technology, including physics, medicine, and engineering. In particle physics, charged particle beams are crucial for probing the fundamental constituents of matter. Accelerators like the Large Hadron Collider use these beams to collide particles at near-light speeds, enabling scientists to study the resulting interactions and discover new particles. In medicine, charged particle beams, particularly proton and ion beams, are used in cancer treatment through a process known as particle therapy. This method allows for precise targeting of tumors with minimal damage to surrounding healthy tissues, offering a significant advantage over conventional radiation therapy. In engineering, charged particle beams are employed in materials science for applications such as ion implantation in semiconductor manufacturing and electron beam welding. Additionally, they are used in microscopy techniques like Scanning Electron Microscopy (SEM) and Transmission Electron Microscopy (TEM), providing high-resolution imaging of materials at the atomic level. The control and manipulation of charged particle beams involve sophisticated technologies, including magnetic and electric fields to steer and focus the particles. This book unfolds the innovative aspects of charged particle beams which will be crucial for the holistic understanding of the subject matter. The topics included in this book on charged particle beams are of utmost significance and bound to provide incredible insights to readers. It is a complete source of knowledge on the present status of this important field.